Engineering & Science
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Tunnel Vision

Dietrich, Jane S. (1990) Tunnel Vision. Engineering and Science, 53 (4). pp. 23-27. ISSN 0013-7812

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At JPL's Microdevices Lab and Caltech's chemistry division, innovations in scanning tunneling microscopy are providing atomic-resolution views of surfaces and below them.

Item Type:Article
Uncontrolled Keywords:Chemistry; Materials science; Microelectronics; Scanning Tunneling Microscope
Record Number:CaltechES:53.4.Tunnel
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Usage Policy:You are granted permission for individual, educational, research and non-commercial reproduction, distribution, display and performance of this work in any format.
Item Category:All Records > Feature Articles
ID Code:3646
Deposited By: Jennifer Hawley
Deposited On:26 Dec 2012 05:27
Last Modified:26 Dec 2012 05:27

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