Dietrich, Jane S. (1990) Tunnel Vision. Engineering and Science, 53 (4). pp. 23-27. ISSN 0013-7812 https://resolver.caltech.edu/CaltechES:53.4.Tunnel
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Abstract
At JPL's Microdevices Lab and Caltech's chemistry division, innovations in scanning tunneling microscopy are providing atomic-resolution views of surfaces and below them.
Item Type: | Article |
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Uncontrolled Keywords: | Chemistry; Materials science; Microelectronics; Scanning Tunneling Microscope |
Record Number: | CaltechES:53.4.Tunnel |
Persistent URL: | https://resolver.caltech.edu/CaltechES:53.4.Tunnel |
Parent URL: | http://resolver.caltech.edu/CaltechES:53.4.0 |
Usage Policy: | You are granted permission for individual, educational, research and non-commercial reproduction, distribution, display and performance of this work in any format. |
Item Category: | All Records > Feature Articles |
ID Code: | 3646 |
Deposited By: | INVALID USER |
Deposited On: | 26 Dec 2012 05:27 |
Last Modified: | 04 Oct 2019 15:18 |
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